References on Diamond and semiconductor properties

Added 2018.04.04


Particle Physics

Theory

An excellent overview of the field of Particle physics is provided in the Los Alamos primer Note that this is a rather old book (1984!). The 'state of the art' has advanced exponentially beyond that, but it has also become exponentially more complex. This is a good short introduction to the basic concepts.

This link points to a collection of lecture notes from my course EP408 on Experimental Methods of Particle and Nuclear physics.

Statistical data analysis


Semiconductor devices and silicon sensor fabrication

TCAD

Weightfield2 is a ROOT based software toolkit to simulate the effect of radiation damage on signal response in semiconductors. Grab the software from the website.
Recent poster presented by a PhD student at VCI2016 on calculations performed with Weightfield2 is available at the conference website.

Fabrication

[02.02.2016] Here are a couple of standard 'how-to' reference books for silicon wafer processing:

  1. Stephen Campell The Science and Engineering of Microelectronic Fabrication 2nd Edition here
  2. James Plummer Silicon VLSI Technology (advanced, most up-to-date)
  3. Peter van Zant Microchip fabrication: a practical guide to semiconductor processing (basics) here
  4. Frank Hartmann Evolution of silicon sensor technology (with focus on applications in particle physics) here

Latest edition hard copy of these books are in the lab.

Some other published papers on semiconductor device specifics

  1. Mehta et al (BARC), Silicon drift detector design and fabrication at CEN Paper here
  2. Effect of annealing temperatures on silicon doped with ion implantation: some papers on temperature and other effects:
  3. Diffusion after doping Silicon

Recent project reports

Photolithography masks are typically designed in CleWin software CleWin 4.1 free trial is available here.
A video tutorial here, and a detailed pdf manual here.

Semiconductor device properties that are too difficult to calculate analytically are usually numerically computed using TCAD software (Technology Computer Aided Design) The commonly used TCAD software packages that we have access to in CEN are: Centaurus, Synopsys and Silvaco. Along with measuring device properties like carrier mobility in the lab, we usually have to predict (or post-dict) these properties using TCAD calculations.


Semiconductor device characterization

[14.03.2016]

  1. HOW-TO on Baseline electrical characterization of (traditional, doped) semiconductor detectors Nicoleta Dinu, Fermilab Seminar 2003

References

Here are a couple of standard references for instrumentation in particle physics. Hard copies of the books are available in my lab or office.


Literature Background - PhD seminar 2015-16 Topics in experimental particle and nuclear physics

Lecture notes

This link points to a collection of lecture notes from my course EP408 on Experimental Methods of Particle and Nuclear physics (Spring 2013).

Please review the lecture notes as per our schedule of meeting every week.

(31.08.2015) Additional reading material on techniques for characterizing semiconductor detectors
See this presentation by Nicoleta Dinu. The presentation is a little old (2003) but the principles are well explained and still relevant.


Physics

Other topics that have come up in discussion